Characteristics of graphene for quantized hall effect measurements

por Elmquist, Randolph E., Shen, Tian, Real, Mariano, Calizo, Irene G., Bush, Brian G., He, Guowei, Yang, Yanfei, Klimov, Nikolai, Newell, David B., Hight-Walker, Angela R., Feenstra, Randall M., National Institute of Standards and Technology. NIST. Gaithersburg, US, INTI-Física y Metrología. Buenos Aires, AR, Carnegie-Mellon University. Pittsburgh, US, Georgetown University. Washington, US, Conference on precision electromagnetic measurements
Publicado 2012

SIM comparison of AC-DC current transfer difference, SIM.EM-K12

por Di Lillo, Lucas, Yasuda, Eliana, Lipe, Thomas, Campos, Sara, Spaggiari, Alfredo, Slomovitz, Daniel, Faverio, Carlos, Filipski, Piotr, Vasconcellos, Renata, Geronymo, Gean, Afonso, Renato, Halawa, Mamdouh, INTI-Física y Metrología. Buenos Aires, AR, National Institute of Standards and Technology. NIST. Gaithersburg, US, Centro Nacional de Metrología. CENAM. Querétaro, MX, Administración Nacional de Usinas y Transmisiones Eléctricas. UTE. Montevideo, UY, National Research Council. NRC. Washington, US, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMETRO. Rio de Janeiro, BR, National Institute for Standards. NIS. Gizah, EG, Conference on Precision Electromagnetic Measurements CPEM 2014 (pp. 268-269)
Publicado 2014