Ring oscillators response to irradiation and application to dosimetry
The response of ring oscillators to ionizing irradiation is investigated, regarding their possible use as dosimeters. Different structures were designed, fabricated and tested. Results show that dose resolution can be improved by one order of magnitude compared to conventional MOS dosimeters built i...
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| Otros Autores: | , , , |
| Formato: | Acta de conferencia Capítulo de libro |
| Lenguaje: | Inglés |
| Publicado: |
2009
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| Acceso en línea: | Registro en Scopus DOI Handle Registro en la Biblioteca Digital |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
| LEADER | 04930caa a22006737a 4500 | ||
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| 001 | PAPER-23002 | ||
| 003 | AR-BaUEN | ||
| 005 | 20250311104613.0 | ||
| 008 | 190411s2009 xx ||||fo|||| 10| 0 eng|d | ||
| 024 | 7 | |2 scopus |a 2-s2.0-71949130165 | |
| 040 | |a Scopus |b spa |c AR-BaUEN |d AR-BaUEN | ||
| 100 | 1 | |a Carbonetto, S. | |
| 245 | 1 | 0 | |a Ring oscillators response to irradiation and application to dosimetry |
| 260 | |c 2009 | ||
| 270 | 1 | 0 | |m Carbonetto, S.; Device Physics Laboratory-Microelectronics, Departamento de Física, Universidad de Buenos Aires, Av. Paseo Colón 850, Buenos Aires, C1063ACV, Argentina |
| 504 | |a Oldham, T.R., Ionizing Radiation Effects in MOS Oxides (1999) Advances in Solid State Electronics and Technology Series, , Singapore: World Scientific | ||
| 504 | |a Holmes-Siedle, A., Adams, L., RADFETs: A Review of the Use of Metal-Oxide-Silicon Devices as Integrating Dosimeters Radiation Physics and Chemistry, 28 (2), pp. 235-244 | ||
| 504 | |a Oldham, T.R., McLean, F.B., Total Ionizing Effects in MOS oxides and Devices (2003) IEEE Trans. Nucl. Sci, 50 (3), pp. 483-499 | ||
| 504 | |a Hughes, H.L., Benedetto, J.M., Radiation Effects and hardening of MOS Technology: Devices and Circuits (2003) IEEE Trans. Nucl. Sci, 50 (3), pp. 500-520 | ||
| 504 | |a Rabaey, J.M., Chandrakasan, A., Nikolic, B., (2003) Digital Integrated Circuits, , Second edition, Prentice-Hall ISBN 1-13-090996- 3 | ||
| 504 | |a Poch, W.J., Holmes-Siedle, A.G., Long-Term Effects Of Radiation On Complementary Mos Logic Networks (1970) IEEE Trans. Nucl. Sci, NS-17 (6), pp. 33-40 | ||
| 504 | |a Lee, D.-S., Chan, C.-Y., Oxide charge accumulation in metal oxide semiconductor devices during irradiation (1991) J. Appl. Phys, 69 (10), pp. 7134-7141. , May | ||
| 504 | |a Shaneyfelt, M.R., Swank, J.R., Fleetwood, D.M., Field Dependence of interface trap buildup in polysilicon and metal gate MOS devices (1990) IEEE Trans. Nucl. Sci, 37 (6), pp. 1632-1639. , Dec | ||
| 504 | |a Vincent R. von Kaenel A High-Speed, low power clock generator for a microprocessor application, IEEE Journal of Solid-Sate Circuits, 33 No. 11, pp. 1634-1639, Nov. 1998; Young, I.A., Greason, J.K., Wong, K.L., A PLL clock generator with 5to 110 MHz of clock range microprocessors (1992) IEEE Journal of Solid-Sate Circuits, 27 (11), pp. 1599-1607. , November | ||
| 504 | |a Hajimiri, A., Limotyrakis, S., Lee, T.H., Jitter and Phase Noise in Ring Oscillators (1999) IEEE Journal of Solid-Sate Circuits, 34 (6), p. 790. , JuneA4 - IEEE; CAS; UCC; INTI; INVAP | ||
| 506 | |2 openaire |e Política editorial | ||
| 520 | 3 | |a The response of ring oscillators to ionizing irradiation is investigated, regarding their possible use as dosimeters. Different structures were designed, fabricated and tested. Results show that dose resolution can be improved by one order of magnitude compared to conventional MOS dosimeters built in the same process. |l eng | |
| 593 | |a Device Physics Laboratory-Microelectronics, Departamento de Física, Universidad de Buenos Aires, Av. Paseo Colón 850, Buenos Aires, C1063ACV, Argentina | ||
| 690 | 1 | 0 | |a DOSIMETRY |
| 690 | 1 | 0 | |a IONIZING RADIATION |
| 690 | 1 | 0 | |a MOS DEVICES |
| 690 | 1 | 0 | |a RING OSCILLATOR |
| 690 | 1 | 0 | |a DIFFERENT STRUCTURE |
| 690 | 1 | 0 | |a IONIZING IRRADIATION |
| 690 | 1 | 0 | |a MOS DOSIMETER |
| 690 | 1 | 0 | |a ORDER OF MAGNITUDE |
| 690 | 1 | 0 | |a RING OSCILLATOR |
| 690 | 1 | 0 | |a DOSIMETERS |
| 690 | 1 | 0 | |a DOSIMETRY |
| 690 | 1 | 0 | |a IONIZING RADIATION |
| 690 | 1 | 0 | |a IRRADIATION |
| 690 | 1 | 0 | |a MOS DEVICES |
| 690 | 1 | 0 | |a NANOELECTRONICS |
| 690 | 1 | 0 | |a OPTICAL DEVICES |
| 690 | 1 | 0 | |a RADIATION SHIELDING |
| 690 | 1 | 0 | |a RADIOACTIVITY |
| 690 | 1 | 0 | |a OSCILLATORS (ELECTRONIC) |
| 700 | 1 | |a Lipovetzky, J. | |
| 700 | 1 | |a Inza, M.G. | |
| 700 | 1 | |a Redin, E. | |
| 700 | 1 | |a Faigón, Adrián Néstor | |
| 711 | 2 | |c Bariloche |d 1 October 2009 through 2 October 2009 |g Código de la conferencia: 78598 | |
| 773 | 0 | |d 2009 |h pp. 1-4 |p Proc. Argent. Sch. Micro-Nanoelectronics, Technol. Appl., EAMTA |n Proceedings of the Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009 |z 9781424448357 |t Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009 | |
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| 856 | 4 | 0 | |u https://doi.org/10.1109/EAMTA.2009.5288910 |x doi |y DOI |
| 856 | 4 | 0 | |u https://hdl.handle.net/20.500.12110/paper_97814244_v_n_p1_Carbonetto |x handle |y Handle |
| 856 | 4 | 0 | |u https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_97814244_v_n_p1_Carbonetto |x registro |y Registro en la Biblioteca Digital |
| 961 | |a paper_97814244_v_n_p1_Carbonetto |b paper |c PE | ||
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