Characterization of porous thin films using quartz crystal shear resonators
A new model for the characterization of porous materials using quartz crystal impedance analysis is proposed. The model describes the equivalent electrical and/or mechanical impedance of the quartz crystal in contact with a finite layer of a rigid porous material which is immersed in a semi-infinite...
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| Formato: | Acta de conferencia Capítulo de libro |
| Lenguaje: | Inglés |
| Publicado: |
ACS
2000
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| Acceso en línea: | Registro en Scopus DOI Handle Registro en la Biblioteca Digital |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
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