Characterization of highly conducting wire gratings using an electromagnetic theory of diffraction

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An electromagnetic method is used to reconstruct the cross section of galvanically manufactured wire gratings from efficiency measurements. The approach, based on a surface impedance approximation, allows us to deal with highly conducting wires of arbitrary cross sections. By varying the wire profil...

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Detalles Bibliográficos
Autores principales: Lochbihler, H., Depine, R.A.
Formato: JOUR
Materias:
Characterization
Conductive materials
Electric impedance measurement
Electric variables measurement
Electromagnetic wave diffraction
Gold
Mathematical models
Morphology
Wire
Laboratory for Space Research
Low energy transmission gratings
Max Planck Institut fuer extraterrestrische Physik
NASA's Advanced X ray Astrophysics Facility (AXAF)
National Aeronautics and Space Administration (NASA)
Diffraction gratings
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00304018_v100_n1-4_p231_Lochbihler
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
Descripción
Sumario:An electromagnetic method is used to reconstruct the cross section of galvanically manufactured wire gratings from efficiency measurements. The approach, based on a surface impedance approximation, allows us to deal with highly conducting wires of arbitrary cross sections. By varying the wire profile parameters, a total coincidence between theory and transmittance measurements in the resonance region can be found for different gold gratings. © 1993.

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