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02957Cam#a22004575i#4500 |
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20220927105642.0 |
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cr nn 008mamaa |
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131022s2014 xxu| s |||| 0|eng d |
| 020 |
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|a 9781461488811
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| 024 |
7 |
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|a 10.1007/978-1-4614-8881-1
|2 doi
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|a TK7888.4
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| 072 |
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|a TJFC
|2 bicssc
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|a TEC008010
|2 bisacsh
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|a Mohammad, Baker.
|9 260181
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|a Embedded Memory Design for Multi-Core and Systems on Chip
|h [libro electrónico] /
|c by Baker Mohammad.
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| 260 |
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1 |
|a New York, NY :
|b Springer New York :
|b Imprint: Springer,
|c 2014.
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| 300 |
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|a xiii, 95 p. :
|b il.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a text file
|b PDF
|2 rda
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| 490 |
1 |
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|a Analog Circuits and Signal Processing,
|x 1872-082X ;
|v 116
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| 505 |
0 |
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|a Introduction -- Cache Architecture and Main Blocks -- Embedded Memory Hierarchy -- SRAM Memory Operation and Yield -- Low Power and High Yield SRAM Memory -- Leakage Reduction -- Embedded Memory Verification -- Embedded Memory Design Validation and Design For Test -- Emerging Memory Technology Opportunities and Challenges.
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| 520 |
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|a This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.  ·        Provides a comprehensive overview of embedded memory design and associated challenges and choices; ·        Explains tradeoffs and dependencies across different disciplines involved with multi-core and system on chip memory design; ·        Includes detailed discussion of memory hierarchy and its impact on energy and performance; ·        Uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis.
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| 650 |
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0 |
|a Engineering.
|9 259622
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| 650 |
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|a Microprocessors.
|9 259640
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| 650 |
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0 |
|a Electronics.
|9 259648
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| 650 |
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|a Microelectronics.
|9 259649
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| 650 |
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0 |
|a Electronic circuits.
|9 259798
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| 650 |
2 |
4 |
|a Circuits and Systems.
|9 259651
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| 650 |
2 |
4 |
|a Instrumentation.
|9 259652
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| 650 |
2 |
4 |
|a Processor Architectures.
|9 259645
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| 776 |
0 |
8 |
|i Printed edition:
|z 9781461488804
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| 856 |
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0 |
|u http://dx.doi.org/10.1007/978-1-4614-8881-1
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| 912 |
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|a ZDB-2-ENG
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| 929 |
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|a COM
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| 942 |
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|c EBK
|6 _
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| 950 |
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|a Engineering (Springer-11647)
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| 999 |
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|a SKV
|c 27553
|d 27553
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