Probe microscopy

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Detalles Bibliográficos
Formato:	Electrónico Revista
Lenguaje:	Inglés
Publicado:	[Amsterdam] Netherlands : Gordon and Breach Science Publishers, c1996-
Materias:	Microscopy > Periodicals. Atomic force microscopy > Periodicals. Electron microscopy > Periodicals. Microscopy, Atomic Force > Periodicals. Microscopy, Electron > Periodicals.
Acceso en línea:	Available in Academic Search Premier.
Aporte de:	Registro referencial: Solicitar el recurso aquí Bibliotecas (UCSF) de Universidad Católica de Santa Fe

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