Modulated speckle simulations based on the random-walk model
The random walk model is employed to simulate modulated speckle patterns. We demonstrate that the geo metrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing this phenomenon is proposed. The validity of the approximations employed is verified by co...
Guardado en:
| Autores principales: | , , , |
|---|---|
| Formato: | Articulo |
| Lenguaje: | Inglés |
| Publicado: |
2003
|
| Materias: | |
| Acceso en línea: | http://sedici.unlp.edu.ar/handle/10915/44355 |
| Aporte de: |
| Sumario: | The random walk model is employed to simulate modulated speckle patterns. We demonstrate that the geo
metrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing
this phenomenon is proposed. The validity of the approximations employed is verified by comparison of the
simulation with the experimental results. Speckle metrological applications and phase measurement tech
niques could be improved by taking advantage of this model. |
|---|