A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture

In this paper, we propose an efficient diagnosis scheme to detect and locate the switching network defects/faults in reconfigurable array architecture. This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occ...

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Autor principal: Chen, Yung-Yuan
Formato: Articulo
Lenguaje:Inglés
Publicado: 2006
Materias:
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/9511
http://journal.info.unlp.edu.ar/wp-content/uploads/JCST-Apr06-3.pdf
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