Formation of an extended CoSi₂ thin nanohexagons array coherently buried in silicon single crystal

A Co-doped silica film was deposited on the surface of a Si(100) wafer and isothermally annealed at 750 °C to form spherical Co nanoparticles embedded in the silica film and a few atomic layer thick CoSi₂ nanoplatelets within the wafer. The structure, morphology, and spatial orientation of the nanop...

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Detalles Bibliográficos
Autores principales: Kellermann, Guinther, Montoro, Luciano A., Giovanetti, Lisandro José, Dos Santos Claro, Paula Cecilia, Zhang, Liang, Ramirez, Antonio J., Requejo, Félix Gregorio, Craievich, Aldo F.
Formato: Articulo
Lenguaje:Inglés
Publicado: 2012
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Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/99645
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Sumario:A Co-doped silica film was deposited on the surface of a Si(100) wafer and isothermally annealed at 750 °C to form spherical Co nanoparticles embedded in the silica film and a few atomic layer thick CoSi₂ nanoplatelets within the wafer. The structure, morphology, and spatial orientation of the nanoplatelets were characterized. The experimental results indicate that the nanoplatelets exhibit hexagonal shape and a uniform thickness. The CoSi₂ nanostructures lattice is coherent with the Si lattice, and each of them is parallel to one of the four planes belonging to the {111} crystallographic form of the host lattice.