Benjamín, M., Silva, H., Monasterios, G., Tempone, N., Henze, A., INTI-Electrónica e Informática. Laboratorio Metrología RF & Microondas. Buenos Aires, A., & 18-19), C. o. P. E. M. C. 2. (. (2014). Multivariate statistics applied to assess measurement uncertainty of complex reflection coefficient. IEEE.
Cita Chicago Style (17a ed.)Benjamín, M., H. Silva, G. Monasterios, N. Tempone, A. Henze, AR INTI-Electrónica e Informática. Laboratorio Metrología RF & Microondas. Buenos Aires, y Conference on Precision Electromagnetic Measurements CPEM 2014 (pp 18-19). Multivariate Statistics Applied to Assess Measurement Uncertainty of Complex Reflection Coefficient. IEEE, 2014.
Cita MLA (8a ed.)Benjamín, M., et al. Multivariate Statistics Applied to Assess Measurement Uncertainty of Complex Reflection Coefficient. IEEE, 2014.