dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes
The space charge layer of chemically deposited CdS film electrodes in different electrolytes was studied by dc surface conductance measurements. The results obtained by this method are compared with those derived from capacitance and modulated transmittance. The values of the flat band potential obt...
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todo:paper_00092614_v256_n4-5_p431_Alcober2023-10-03T14:08:16Z dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes Alcober, C. Bilmes, S.A. The space charge layer of chemically deposited CdS film electrodes in different electrolytes was studied by dc surface conductance measurements. The results obtained by this method are compared with those derived from capacitance and modulated transmittance. The values of the flat band potential obtained for 800 nm thick films in 0.1 M Na 2 SO 4 by the three methods are in good agreement. The influence of sulfide concentration in the electrolyte was analyzed, and the limitations of the dc surface conductance technique for films thinner than 200 nm are discussed. Fil:Alcober, C. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Bilmes, S.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00092614_v256_n4-5_p431_Alcober |
institution |
Universidad de Buenos Aires |
institution_str |
I-28 |
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R-134 |
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
description |
The space charge layer of chemically deposited CdS film electrodes in different electrolytes was studied by dc surface conductance measurements. The results obtained by this method are compared with those derived from capacitance and modulated transmittance. The values of the flat band potential obtained for 800 nm thick films in 0.1 M Na 2 SO 4 by the three methods are in good agreement. The influence of sulfide concentration in the electrolyte was analyzed, and the limitations of the dc surface conductance technique for films thinner than 200 nm are discussed. |
format |
JOUR |
author |
Alcober, C. Bilmes, S.A. |
spellingShingle |
Alcober, C. Bilmes, S.A. dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
author_facet |
Alcober, C. Bilmes, S.A. |
author_sort |
Alcober, C. |
title |
dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
title_short |
dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
title_full |
dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
title_fullStr |
dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
title_full_unstemmed |
dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
title_sort |
dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes |
url |
http://hdl.handle.net/20.500.12110/paper_00092614_v256_n4-5_p431_Alcober |
work_keys_str_mv |
AT alcoberc dcsurfaceconductanceasatoolforthestudyofthespacechargelayerofthinfilmsemiconductorelectrodes AT bilmessa dcsurfaceconductanceasatoolforthestudyofthespacechargelayerofthinfilmsemiconductorelectrodes |
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1807317893519507456 |