Cita APA (7a ed.)

Ciocci Brazzano, L., Sorichetti, P., Santiago, G., & González, M. Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K.

Cita Chicago Style (17a ed.)

Ciocci Brazzano, L., P.A Sorichetti, G.D Santiago, y M.G González. Broadband Dielectric Characterization of Piezoelectric Poly(vinylidene Fluoride)thin Films Between 278 K and 308 K.

Cita MLA (8a ed.)

Ciocci Brazzano, L., et al. Broadband Dielectric Characterization of Piezoelectric Poly(vinylidene Fluoride)thin Films Between 278 K and 308 K.