Field enhancement in laser assisted scanning tunneling microscope

The coupling of laser radiation into the Scanning Probe Microscope junction offers a powerful tool to investigate optical and spectroscopic properties of diverse surfaces with high spatial resolution. The study of strong laser field enhancement at the junction produced by the proximity between the t...

Descripción completa

Detalles Bibliográficos
Autor principal: Bragas, A.V.
Formato: JOUR
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_02043467_v1998_n9-10_p1_Bragas
Aporte de:
id todo:paper_02043467_v1998_n9-10_p1_Bragas
record_format dspace
spelling todo:paper_02043467_v1998_n9-10_p1_Bragas2023-10-03T15:09:57Z Field enhancement in laser assisted scanning tunneling microscope Bragas, A.V. The coupling of laser radiation into the Scanning Probe Microscope junction offers a powerful tool to investigate optical and spectroscopic properties of diverse surfaces with high spatial resolution. The study of strong laser field enhancement at the junction produced by the proximity between the tip and the sample in a laser assisted Scanning Tunneling Microscope (STM) configuration is a matter of growing interest due to the broad possibilities opened in the field of nanomodification, microscopy and spectroscopy of surfaces. In this paper the latest results in field enhancement in a laser assisted STM are reviewed. Fil:Bragas, A.V. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_02043467_v1998_n9-10_p1_Bragas
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
description The coupling of laser radiation into the Scanning Probe Microscope junction offers a powerful tool to investigate optical and spectroscopic properties of diverse surfaces with high spatial resolution. The study of strong laser field enhancement at the junction produced by the proximity between the tip and the sample in a laser assisted Scanning Tunneling Microscope (STM) configuration is a matter of growing interest due to the broad possibilities opened in the field of nanomodification, microscopy and spectroscopy of surfaces. In this paper the latest results in field enhancement in a laser assisted STM are reviewed.
format JOUR
author Bragas, A.V.
spellingShingle Bragas, A.V.
Field enhancement in laser assisted scanning tunneling microscope
author_facet Bragas, A.V.
author_sort Bragas, A.V.
title Field enhancement in laser assisted scanning tunneling microscope
title_short Field enhancement in laser assisted scanning tunneling microscope
title_full Field enhancement in laser assisted scanning tunneling microscope
title_fullStr Field enhancement in laser assisted scanning tunneling microscope
title_full_unstemmed Field enhancement in laser assisted scanning tunneling microscope
title_sort field enhancement in laser assisted scanning tunneling microscope
url http://hdl.handle.net/20.500.12110/paper_02043467_v1998_n9-10_p1_Bragas
work_keys_str_mv AT bragasav fieldenhancementinlaserassistedscanningtunnelingmicroscope
_version_ 1807324476452372480