Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization

In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diff...

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Detalles Bibliográficos
Autores principales: Domené, E.A., Mingolo, N., Martínez, O.E.
Formato: CONF
Materias:
Probes
Thermal diffusivity
Defocusing
Detection scheme
Micro-structural characterization
Microscopic levels
Pump modulation
Sample surface
Surface curvatures
Surface deformation
Thermal expansion
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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