Combination of quartz crystal microbalance with other techniques
As implied by its acronym, the quartz crystal microbalance was first used to determine the mass of material deposited on its surface. A heuristic description of the linear relation between the change in its resonant frequency Δf, from its unloaded resonant frequency f0, and the mass density, m, was...
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todo:paper_97835407_v_n_p307_Calvo2023-10-03T16:45:09Z Combination of quartz crystal microbalance with other techniques Calvo, E. Kanazawa, K. Perrot, H. Jimenez, Y. As implied by its acronym, the quartz crystal microbalance was first used to determine the mass of material deposited on its surface. A heuristic description of the linear relation between the change in its resonant frequency Δf, from its unloaded resonant frequency f0, and the mass density, m, was recognized by Sauerbrey [1] and led to the now standard use of the QCM to measure mass deposition. This Sauerbrey relation is described by (Eq. 3.10): Δf =-2f02/√ ρQμQ m' (13.1) The coefficient preceding m is a fixed quantity, depending only on the parameters of the unloaded quartz. Using this relation, one can determine the mass density (kg/m2) deposited onto the QCM surface. Although the range of validity of Eq. (13.1) has limits, it has created a whole industry to measure deposition. From the single measurable of Δf, one can measure the single parameter m. As shown in Chaps. 3 and 14, it is possible to extract more information from the QCM. For example, when m exceeds certain values, Eq. (13.1) is no longer satisfied. A non-linear behavior is observed and the shape of the non-linearity can be used to extract information on elastic films concerning the shear modulus, G1, of the film (Chap. 14). This was put on a quantitative basis by Lu and Lewis in 1972 [2]. More recently, there are activestudies on the determination of many other parameters using the QCM. Some of the variables affecting the measurements have been recently cited by Lucklum [3]. Even for a simple example, when there is a viscoelastic film on the QCM and the quartz/film is immersed in a liquid, there are a number of parameters which are involved in QCM measurements. In addition to the quartz parameters, there are the density of the film ρ1, the shear storage modulus of the film G1, the shear loss modulus of the film G1, the thickness of the film h1, the density of the liquid ρ 2, the shear loss modulus of the liquid G2 and the shear storage modulus of the liquid G2. It is clear that there are a large number of parameters that influence the behavior of the QCM. Most of the measurable to date have focused on two values, the change in frequency and the change in dissipation as the QCM is loaded. It is not possible to deconvolute these two variables into a determination of the materials parameters (see Chap. 14). Therefore, it is not surprising that additional measurements in conjunction with the QCM measurements are being undertaken to increase the number of measureables. © Springer-Verlag Berlin Heidelberg 2008. Fil:Calvo, E. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. CHAP info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_97835407_v_n_p307_Calvo |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-134 |
| collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
| description |
As implied by its acronym, the quartz crystal microbalance was first used to determine the mass of material deposited on its surface. A heuristic description of the linear relation between the change in its resonant frequency Δf, from its unloaded resonant frequency f0, and the mass density, m, was recognized by Sauerbrey [1] and led to the now standard use of the QCM to measure mass deposition. This Sauerbrey relation is described by (Eq. 3.10): Δf =-2f02/√ ρQμQ m' (13.1) The coefficient preceding m is a fixed quantity, depending only on the parameters of the unloaded quartz. Using this relation, one can determine the mass density (kg/m2) deposited onto the QCM surface. Although the range of validity of Eq. (13.1) has limits, it has created a whole industry to measure deposition. From the single measurable of Δf, one can measure the single parameter m. As shown in Chaps. 3 and 14, it is possible to extract more information from the QCM. For example, when m exceeds certain values, Eq. (13.1) is no longer satisfied. A non-linear behavior is observed and the shape of the non-linearity can be used to extract information on elastic films concerning the shear modulus, G1, of the film (Chap. 14). This was put on a quantitative basis by Lu and Lewis in 1972 [2]. More recently, there are activestudies on the determination of many other parameters using the QCM. Some of the variables affecting the measurements have been recently cited by Lucklum [3]. Even for a simple example, when there is a viscoelastic film on the QCM and the quartz/film is immersed in a liquid, there are a number of parameters which are involved in QCM measurements. In addition to the quartz parameters, there are the density of the film ρ1, the shear storage modulus of the film G1, the shear loss modulus of the film G1, the thickness of the film h1, the density of the liquid ρ 2, the shear loss modulus of the liquid G2 and the shear storage modulus of the liquid G2. It is clear that there are a large number of parameters that influence the behavior of the QCM. Most of the measurable to date have focused on two values, the change in frequency and the change in dissipation as the QCM is loaded. It is not possible to deconvolute these two variables into a determination of the materials parameters (see Chap. 14). Therefore, it is not surprising that additional measurements in conjunction with the QCM measurements are being undertaken to increase the number of measureables. © Springer-Verlag Berlin Heidelberg 2008. |
| format |
CHAP |
| author |
Calvo, E. Kanazawa, K. Perrot, H. Jimenez, Y. |
| spellingShingle |
Calvo, E. Kanazawa, K. Perrot, H. Jimenez, Y. Combination of quartz crystal microbalance with other techniques |
| author_facet |
Calvo, E. Kanazawa, K. Perrot, H. Jimenez, Y. |
| author_sort |
Calvo, E. |
| title |
Combination of quartz crystal microbalance with other techniques |
| title_short |
Combination of quartz crystal microbalance with other techniques |
| title_full |
Combination of quartz crystal microbalance with other techniques |
| title_fullStr |
Combination of quartz crystal microbalance with other techniques |
| title_full_unstemmed |
Combination of quartz crystal microbalance with other techniques |
| title_sort |
combination of quartz crystal microbalance with other techniques |
| url |
http://hdl.handle.net/20.500.12110/paper_97835407_v_n_p307_Calvo |
| work_keys_str_mv |
AT calvoe combinationofquartzcrystalmicrobalancewithothertechniques AT kanazawak combinationofquartzcrystalmicrobalancewithothertechniques AT perroth combinationofquartzcrystalmicrobalancewithothertechniques AT jimenezy combinationofquartzcrystalmicrobalancewithothertechniques |
| _version_ |
1807320742623182848 |