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MOS devices
4
Radiation effects
4
radiation effects
Absorbed dose
2
Alumina
2
Analytic expressions
2
Capacitance
2
Capacitance voltage
2
Comparative analysis
2
Dosimetry
2
Error compensation
2
Experimental data
2
Gamma photons
2
Hafnium oxides
2
High-k dielectric
2
High-k gate dielectrics
2
Interface traps
2
Ionizing radiation
2
Irradiation
2
Metal oxide semiconductor
2
Metallic compounds
2
Nanolaminate
2
Oxygen ions
2
Radiation shielding
2
Semiconductor devices
2
Temperature
2
Temperature fluctuation
2
Thick gate oxides
2
Zero temperature coefficients
2
ionizing radiation sensors
2
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4