MODERN developments in electron microscopy /
Guardado en:
| Formato: | Libro |
|---|---|
| Lenguaje: | Inglés |
| Publicado: |
New York :
Academic,
1964.
|
| Materias: | |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
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| 245 | 0 | 0 | |a MODERN developments in electron microscopy / |c edited by Benjamin M. Siegel. |
| 260 | |a New York : |b Academic, |c 1964. | ||
| 500 | |a Bibliografía al final de cap. | ||
| 080 | |a 539.27 |2 3 abrev. esp. | ||
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| 300 | |a xiii, 432 p. : |b il. ; |c 24 cm. | ||
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