Reflection electron microscopy and spectroscopy for surface analysis /
Guardado en:
| Autor principal: | |
|---|---|
| Formato: | Libro |
| Lenguaje: | Inglés |
| Publicado: |
Cambridge ; New York :
Cambridge University Press,
1996.
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| Materias: | |
| Acceso en línea: | Reseña Indice |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
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| 245 | 1 | 0 | |a Reflection electron microscopy and spectroscopy for surface analysis / |c Zhong Lin Wang. |
| 260 | # | # | |a Cambridge ; |a New York : |b Cambridge University Press, |c 1996. |
| 300 | # | # | |a xix, 436 p. : |b il. ; |c 26 cm. |
| 504 | # | # | |a Bibliografía: p. 419-430. |
| 020 | # | # | |a 0521482666 |
| 020 | # | # | |a 0521017955 (pbk) |
| 100 | 1 | # | |a Wang, Zhong Lin. |
| 080 | # | # | |a 537.533.35:538.971 |
| 650 | # | 0 | |a Materials |x Microscopy. |
| 650 | # | 0 | |a Surfaces (Technology) |x Analysis. |
| 650 | # | 0 | |a Reflection electron microscopy. |
| 650 | # | 7 | |a Microscopía electrónica |e Superficies. |2 inist |
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