How to increase the sensitivity in a polarization interferometer
Two methods to measure the difference between the phase shifts in a dielectric reflection and a metal one are compared. Both methods consist of using a Smith-type interferometer, and they differ in the analyzer used. © 1991, Optical Society of America.
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| Formato: | Capítulo de libro |
| Lenguaje: | Inglés |
| Publicado: |
1991
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| Acceso en línea: | Registro en Scopus DOI Handle Registro en la Biblioteca Digital |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
| LEADER | 02299caa a22003377a 4500 | ||
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| 008 | 190411s1991 xx ||||fo|||| 00| 0 eng|d | ||
| 024 | 7 | |2 scopus |a 2-s2.0-0013366580 | |
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| 100 | 1 | |a Echarri, Rodolfo Manuel | |
| 245 | 1 | 4 | |a How to increase the sensitivity in a polarization interferometer |
| 260 | |c 1991 | ||
| 504 | |a Born, M., Wolf, E., (1975) Principles of Optics, , Pergamon, Oxford | ||
| 504 | |a Sommerfield, A., Vorlesungen iiber Theoretische Physik (1959) Band, 4. , OptikAkademische Verlagsgesellschaft, Leipzig | ||
| 504 | |a Simon, M.C., Simon, J.M., Garea, M.T., Phase shift in dielectric reflection (1987) Appl. Opt., 26, pp. 3871-3877 | ||
| 504 | |a Simon, M.C., Perez, L., Reflexion metalica: Coeficientes de reflexion y contraste de franjas Opt. Pura Appl. (To Be Published) | ||
| 504 | |a Frangon, M., Mallick, S., (1971) Polarization Interferometers, , Wiley Interscience, New York | ||
| 506 | |2 openaire |e Política editorial | ||
| 520 | 3 | |a Two methods to measure the difference between the phase shifts in a dielectric reflection and a metal one are compared. Both methods consist of using a Smith-type interferometer, and they differ in the analyzer used. © 1991, Optical Society of America. |l eng | |
| 593 | |a Departamento de Fisica, Facul-tad de Ciencias Exactas y Naturales Ciudad Universi-taria, Pab. 1, Buenos Aires, 1428, Argentina | ||
| 700 | 1 | |a Simon, J.M. | |
| 700 | 1 | |a Simon, M.C. | |
| 773 | 0 | |d 1991 |g v. 30 |h pp. 4483-4486 |k n. 31 |p Appl. Opt. |x 1559128X |t Applied Optics | |
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