On the use of cross-polarization measurements in the detection of grating asymmetries

The differences in the curves of the zeroth order cross-polarization reflection coefficients (p → s and s → p) versus angle of incidence have remarkable potential for application in scatterometry since, if larger than the measurement error, could allow for a reliable nondestructive technique to dete...

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Autor principal: Depine, Ricardo Angel
Otros Autores: Kaufmann, G.H
Formato: Acta de conferencia Capítulo de libro
Lenguaje:Inglés
Publicado: 2001
Acceso en línea:Registro en Scopus
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100 1 |a Depine, Ricardo Angel 
245 1 3 |a On the use of cross-polarization measurements in the detection of grating asymmetries 
260 |c 2001 
270 1 0 |m Depine, R.A.; Grupo de Electromagnetismo Aplicado, Departamento de Física, Universidad de Buenos Aires, 1428 Buenos Aires, Argentina; email: rdep@df.uba.ar 
504 |a Logofatu, P.C., Coulombe, S.A., Minhas, B.K., Mc-Neil, J.R., Identity of the cross-reflection coefficients for the symmetric surface-relief gratings (1999) J. Opt. Soc. Am. A, 16, pp. 1108-1114 
504 |a Li, L., Symmetries of cross-polarization diffraction coefficients of gratings (2000) J. Opt. Soc. Am. A, 17, pp. 881-887 
504 |a Vincent, P., Nevière, M., The reciprocity theorem for corrugated surfaces used in conical diffraction mountings (1979) Opt. Acta, 26, pp. 889-898 
504 |a Depine, R., Valencia, C., Reciprocity relations for s-p polarization conversion in conical diffraction (1995) Opt. Commun., 117, pp. 223-227 
504 |a Depine, R., Valencia, C., Reciprocity relations for s-p polarization conversion in conical diffraction: Erratum (2001) Opt. Commun., 190, p. 391 
504 |a Chandezon, J., Dupuis, M., Cornet, G., Maystre, D., Multicoated gratings: A differential formalism applicable in the entire optical region (1982) J. Opt. Soc. Am. A, 72, pp. 839-846 
504 |a Li, L., Multilayer-coated diffraction gratings: Differential method of Chandezon et al. revisited (1994) J. Opt. Soc. Am. A, 11, pp. 2816-2828A4 - SPIE; Laseroptics SA (Argentina); Optical Society of America; International Commission for Optics; Spectra-Physics GmbH (Germany) 
506 |2 openaire  |e Política editorial 
520 3 |a The differences in the curves of the zeroth order cross-polarization reflection coefficients (p → s and s → p) versus angle of incidence have remarkable potential for application in scatterometry since, if larger than the measurement error, could allow for a reliable nondestructive technique to detect asymmetries in grating profiles. In this paper the cross-polarization efficiencies of metallic gratings with asymmetric grooves are investigated theoretically by means of a rigorous electromagnetic code. The results show that the differences between p → s and s → p conversion efficiencies tend to be undetectable for highly conducting materials, limiting, in principle, the application of this potential detection technique.  |l eng 
593 |a Grupo de Electromagnetismo Aplicado, Departamento de Física, Universidad de Buenos Aires, 1428 Buenos Aires, Argentina 
690 1 0 |a CHARACTERIZATION TECHNIQUES 
690 1 0 |a ELIPSOMETRY 
690 1 0 |a GRATINGS 
690 1 0 |a SCATTEROMETRY 
690 1 0 |a COMPUTER SIMULATION 
690 1 0 |a ELLIPSOMETRY 
690 1 0 |a ERROR ANALYSIS 
690 1 0 |a LIGHT POLARIZATION 
690 1 0 |a LIGHT REFLECTION 
690 1 0 |a LIGHT SCATTERING 
690 1 0 |a CROSS-POLARIZATION ASYMMETRIES 
690 1 0 |a GRATING ASYMMETRIES 
690 1 0 |a DIFFRACTION GRATINGS 
700 1 |a Kaufmann, G.H. 
711 2 |c Tandil  |d 3 September 2001 through 7 September 2001  |g Código de la conferencia: 59919 
773 0 |d 2001  |g v. 4419  |h pp. 773-775  |p Proc SPIE Int Soc Opt Eng  |n Proceedings of SPIE - The International Society for Optical Engineering  |x 0277786X  |t 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications 
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