Scanning electrochemical microscopy measurement of ferrous ion fluxes during localized corrosion of steel

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Local fluxes of ferrous ions at low carbon steel surfaces coated with tin and an epoxy-phenolic resin on tinplate samples, and at chrome steel (tin-free steel) have been monitored by oxidation of Fe2+ ions at the tip of a Pt scanning electrochemical microscope (SECM). The samples were immersed in 10...

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Detalles Bibliográficos
Autor principal: Völker, E.
Otros Autores: Inchauspe, C.G, Calvo, E.J
Formato: Capítulo de libro
Lenguaje:Inglés
Publicado: 2006
Materias:
CORROSION
Acceso en línea:Registro en Scopus
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030 |a ECCMF 
100 1 |a Völker, E. 
245 1 0 |a Scanning electrochemical microscopy measurement of ferrous ion fluxes during localized corrosion of steel 
260 |c 2006 
270 1 0 |m Calvo, E.J.; INQUIMAE, Departamento de Química Inorgánica, Analítica y Química Física, Ciudad Universitaria Pabellon 2, Buenos Aires C1428EHA, Argentina; email: calvo@qi.fcen.uba.ar 
506 |2 openaire  |e Política editorial 
504 |a Feser, R., Stratmann, M., (1990) Steel Res., 61, p. 482 
504 |a Mansfeld, F., (1995) J. Appl. Electrochem., 25, p. 187 
504 |a Frankel, G.S., Landolt, D., (2003) Encyclopedia of Electrochemistry, 4. , A.J. Bard M. Stratmann Wiley-VCH Weinheim 
504 |a Isaacs, H.S., Kendig, M.W., (1980) Corrosion (NACE), 36, p. 269 
504 |a Zou, F., Thierry, D., Isaacs, H.S., (1997) J. Electrochem. Soc., 144, p. 1957 
504 |a Wharton, J.A., Mellor, B.G., Wood, R.J.K., Smith, C.J.E., (2000) J. Electrochem. Soc., 147, p. 3294 
504 |a Isaacs, H.S., (1988) J. Electrochem. Soc., 135, p. 2180 
504 |a Jiang, X.C., Yoshimura, T., Ishikawa, Y., Shinohara, T., Tsujikawa, S., (1992) J. Electrochem. Soc., 139, p. 1001 
504 |a Isaacs, H.S., Huang, S.-M., Jovancicevic, V., (1996) J. Electrochem. Soc., 143, pp. L178 
504 |a Wilson, B.P., Worsley, D.A., McMurray, H.N., Searle, J.R., (2004) J. Corros. Sci. Eng., 7 
504 |a Oriani, R.A., Yee, S., Stratmann, M., (1991) J. Electrochem. Soc., 138, p. 55 
504 |a Hassel, A.W., Lohrengel, M.M., (1997) Electrochim. Acta, 42, p. 3327 
504 |a Hassel, A.W., Seo, M., (1999) Electrochim. Acta, 44, p. 3769 
504 |a Suter, T., Bohni, H., (2001) Electrochim. Acta, 47, p. 191 
504 |a Andreatta, F., Lohrengel, M.M., Terryn, H., De Wit, J.H.W., (2003) Electrochim. Acta, 48, p. 3239 
504 |a Casillas, N., Charlebois, S., Smyrl, W.H., White, H.S., (1993) J. Electrochem. Soc., 140, pp. L142 
504 |a Casillas, N., Charlebois, S., Smyrl, W.H., White, H.S., (1994) J. Electrochem. Soc., 141, p. 636 
504 |a Paik, C.H., White, H.S., Alkire, R.C., (2000) J. Electrochem. Soc., 147, p. 4120 
504 |a Serebrennikova, I., White, H.S., (2001) Electrochem. Solid-State Lett., 4, pp. B4 
504 |a Wipf, D.O., (1994) Colloid. Surf. A, 93, p. 251 
504 |a Zhu, Y., Williams, D.E., (1997) J. Electrochem. Soc., 144, pp. L43 
504 |a Fushimi, K., Seo, M., (2001) Electrochim. Acta, 47, p. 121 
504 |a Lister, T.E., Pinhero, P.J., (2002) Electrochem. Solid-State Lett., 5, pp. B33 
504 |a Lister, T.E., Pinhero, P.J., (2003) Electrochim. Acta, 48, p. 2371 
504 |a Bastos, A.C., Simoes, A.M., Gonzalez, S., Gonzalez-Garcia, Y., Souto, R.M., (2004) Electrochem. Commun., 6, p. 1212 
504 |a Gonzalez-Garcia, Y., Burstein, G.T., Gonzalez, S., Souto, R.M., (2004) Electrochem. Commun., 6, p. 637 
504 |a Souto, R.M., Gonzalez-Garcia, Y., Gonzalez, S., Burstein, G.T., (2004) Corros. Sci., 46, p. 2621 
504 |a Katemann, B.B., Schulte, A., Calvo, E.J., Koudelka-Hep, M., Schuhmann, W., (2002) Electrochem. Commun., 4, p. 134 
504 |a Katemann, B.B., Inchauspe, C.G., Castro, P.A., Schulte, A., Calvo, E.J., Schuhmann, W., (2003) Electrochim. Acta, 48, p. 1115 
504 |a Heusler, K.E., (1958) Z. Elektrochem., 62, p. 582 
504 |a Bard, A.J., (2001) Scanning Electrochemical Microscopy, , A.J. Bard M.V. Mirkin Marcel Dekker Inc. New York 
504 |a Trevani, L.N., Calvo, E.J., Corti, H.R., (1997) J. Chem. Soc., Faraday Trans., 93, p. 4319 
504 |a Martin, R.D., Unwin, P.R., (1998) Anal. Chem., 70, p. 276 
520 3 |a Local fluxes of ferrous ions at low carbon steel surfaces coated with tin and an epoxy-phenolic resin on tinplate samples, and at chrome steel (tin-free steel) have been monitored by oxidation of Fe2+ ions at the tip of a Pt scanning electrochemical microscope (SECM). The samples were immersed in 10 mM H2SO4 in order to avoid Fe(OH)3 precipitation. The SECM was employed in the collection mode at constant height (≈ 10-15 μm) on an x-y plane above the sample, monitoring the tip current as a function of tip location. © 2005 Elsevier B.V. All rights reserved.  |l eng 
536 |a Detalles de la financiación: The authors thank Tenaris Corporation for supplying the samples and technical support. E.V. thanks Tenaris Corporation for a research student fellowship. 
593 |a INQUIMAE, Departamento de Química Inorgánica, Analítica y Química Física, Ciudad Universitaria Pabellon 2, Buenos Aires C1428EHA, Argentina 
690 1 0 |a LOCALISED CORROSION 
690 1 0 |a SCANNING ELECTROCHEMICAL MICROSCOPY 
690 1 0 |a SECM 
690 1 0 |a TIN-FREE STEEL 
690 1 0 |a TINPLATE 
690 1 0 |a CARBON STEEL 
690 1 0 |a ELECTROCHEMISTRY 
690 1 0 |a EPOXY RESINS 
690 1 0 |a OXIDATION 
690 1 0 |a PRECIPITATION (CHEMICAL) 
690 1 0 |a SCANNING ELECTRON MICROSCOPY 
690 1 0 |a LOCALIZED CORROSION 
690 1 0 |a SECM 
690 1 0 |a TIN-FREE STEEL 
690 1 0 |a TINPLATE 
690 1 0 |a IONS 
650 1 7 |2 spines  |a CORROSION 
700 1 |a Inchauspe, C.G. 
700 1 |a Calvo, E.J. 
773 0 |d 2006  |g v. 8  |h pp. 179-183  |k n. 1  |p Electrochem. Commun.  |x 13882481  |w (AR-BaUEN)CENRE-1729  |t Electrochemistry Communications 
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856 4 0 |u https://doi.org/10.1016/j.elecom.2005.10.003  |y DOI 
856 4 0 |u https://hdl.handle.net/20.500.12110/paper_13882481_v8_n1_p179_Volker  |y Handle 
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