In situ electrical characterization of palladium-based single electron transistors made by electromigration technique

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Detalles Bibliográficos
Autores principales: Arzubiaga, L., Golmar, F., Llopis, R., Casanova, F., Hueso, L. E.
Formato: article
Lenguaje:Inglés
Publicado: AIP Publishing 2014
Materias:
Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
Acceso en línea:http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH01cf/75392c65.dir/doc.pdf
Aporte de:
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) de INTI
id I60-R166HASH01cf75392c6564912006e235
record_format dspace
institution INTI
institution_str I-60
repository_str R-166
collection Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
language Inglés
orig_language_str_mv eng
topic Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
spellingShingle Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
Arzubiaga, L.
Golmar, F.
Llopis, R.
Casanova, F.
Hueso, L. E.
In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
format article
author Arzubiaga, L.
Golmar, F.
Llopis, R.
Casanova, F.
Hueso, L. E.
author_facet Arzubiaga, L.
Golmar, F.
Llopis, R.
Casanova, F.
Hueso, L. E.
author_sort Arzubiaga, L.
title In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_short In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_full In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_fullStr In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_full_unstemmed In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_sort in situ electrical characterization of palladium-based single electron transistors made by electromigration technique
publisher AIP Publishing
publishDate 2014
url http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH01cf/75392c65.dir/doc.pdf
work_keys_str_mv AT arzubiagal insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT golmarf insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT llopisr insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT casanovaf insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT huesole insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
bdutipo_str Repositorios
_version_ 1764820544676429825

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