Aberrations in plane grating spectrometers
The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making us...
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1983
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Acceso en línea: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v30_n6_p777_Gil http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil |
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paper:paper_00303909_v30_n6_p777_Gil2023-06-08T14:55:46Z Aberrations in plane grating spectrometers The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making use of the opportunity provided by the method, the aberrations in each system are rapidly analysed in order to make a first selection among the designs under consideration. The analytical results are compared with those obtained by ray tracing. The study shows clearly the optimal field of application of each design. © 1983 Taylor and Francis Group, LLC. 1983 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v30_n6_p777_Gil http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil |
institution |
Universidad de Buenos Aires |
institution_str |
I-28 |
repository_str |
R-134 |
collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
description |
The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making use of the opportunity provided by the method, the aberrations in each system are rapidly analysed in order to make a first selection among the designs under consideration. The analytical results are compared with those obtained by ray tracing. The study shows clearly the optimal field of application of each design. © 1983 Taylor and Francis Group, LLC. |
title |
Aberrations in plane grating spectrometers |
spellingShingle |
Aberrations in plane grating spectrometers |
title_short |
Aberrations in plane grating spectrometers |
title_full |
Aberrations in plane grating spectrometers |
title_fullStr |
Aberrations in plane grating spectrometers |
title_full_unstemmed |
Aberrations in plane grating spectrometers |
title_sort |
aberrations in plane grating spectrometers |
publishDate |
1983 |
url |
https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v30_n6_p777_Gil http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil |
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1768544167566245888 |