Aberrations in plane grating spectrometers

The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making us...

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Publicado: 1983
Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v30_n6_p777_Gil
http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil
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spelling paper:paper_00303909_v30_n6_p777_Gil2023-06-08T14:55:46Z Aberrations in plane grating spectrometers The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making use of the opportunity provided by the method, the aberrations in each system are rapidly analysed in order to make a first selection among the designs under consideration. The analytical results are compared with those obtained by ray tracing. The study shows clearly the optimal field of application of each design. © 1983 Taylor and Francis Group, LLC. 1983 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v30_n6_p777_Gil http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
description The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making use of the opportunity provided by the method, the aberrations in each system are rapidly analysed in order to make a first selection among the designs under consideration. The analytical results are compared with those obtained by ray tracing. The study shows clearly the optimal field of application of each design. © 1983 Taylor and Francis Group, LLC.
title Aberrations in plane grating spectrometers
spellingShingle Aberrations in plane grating spectrometers
title_short Aberrations in plane grating spectrometers
title_full Aberrations in plane grating spectrometers
title_fullStr Aberrations in plane grating spectrometers
title_full_unstemmed Aberrations in plane grating spectrometers
title_sort aberrations in plane grating spectrometers
publishDate 1983
url https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v30_n6_p777_Gil
http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil
_version_ 1768544167566245888