Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the r...
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1998
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| Acceso en línea: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla http://hdl.handle.net/20.500.12110/paper_00304026_v107_n4_p141_Pla |
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paper:paper_00304026_v107_n4_p141_Pla |
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paper:paper_00304026_v107_n4_p141_Pla2023-06-08T14:56:11Z Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach Approximation theory Conductive materials Diffraction gratings Electromagnetic field theory Optics Antireflective textured surfaces Ray tracing Antireflection coatings We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the ray optics approach and the other based on rigorous electromagnetic theory. As a first approach to the real problem, we consider a perfect conductive media. The parameter used for the characterisation of the problem is the wavelength to period ratio λ/d. The theoretical analysis presented here shows important discrepancies between the results obtained using the ray tracing approximation and those obtained using a rigorous electromagnetic method, even for small values of λ/d (of the order of 0.1) for which the geometrical optics approach is usually expected to hold. 1998 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla http://hdl.handle.net/20.500.12110/paper_00304026_v107_n4_p141_Pla |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-134 |
| collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
| topic |
Approximation theory Conductive materials Diffraction gratings Electromagnetic field theory Optics Antireflective textured surfaces Ray tracing Antireflection coatings |
| spellingShingle |
Approximation theory Conductive materials Diffraction gratings Electromagnetic field theory Optics Antireflective textured surfaces Ray tracing Antireflection coatings Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| topic_facet |
Approximation theory Conductive materials Diffraction gratings Electromagnetic field theory Optics Antireflective textured surfaces Ray tracing Antireflection coatings |
| description |
We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the ray optics approach and the other based on rigorous electromagnetic theory. As a first approach to the real problem, we consider a perfect conductive media. The parameter used for the characterisation of the problem is the wavelength to period ratio λ/d. The theoretical analysis presented here shows important discrepancies between the results obtained using the ray tracing approximation and those obtained using a rigorous electromagnetic method, even for small values of λ/d (of the order of 0.1) for which the geometrical optics approach is usually expected to hold. |
| title |
Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| title_short |
Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| title_full |
Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| title_fullStr |
Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| title_full_unstemmed |
Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach |
| title_sort |
ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: a first approach |
| publishDate |
1998 |
| url |
https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v107_n4_p141_Pla http://hdl.handle.net/20.500.12110/paper_00304026_v107_n4_p141_Pla |
| _version_ |
1768545250508275712 |