Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization

In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diff...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Domené, Esteban A., Mingolo, Nélida, Martínez, Oscar Eduardo
Publicado:	2013
Materias:	Probes Thermal diffusivity Defocusing Detection scheme Micro-structural characterization Microscopic levels Pump modulation Sample surface Surface curvatures Surface deformation Thermal expansion
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_02729172_v1526_n_p47_Domene http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	paper:paper_02729172_v1526_n_p47_Domene
record_format	dspace
spelling	paper:paper_02729172_v1526_n_p47_Domene2023-06-08T15:25:27Z Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization Domené, Esteban A. Mingolo, Nélida Martínez, Oscar Eduardo Probes Thermal diffusivity Defocusing Detection scheme Micro-structural characterization Microscopic levels Pump modulation Sample surface Surface curvatures Surface deformation Thermal expansion In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved. © 2013 Materials Research Society. Fil:Domené, E.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Mingolo, N. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Martínez, O.E. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 2013 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_02729172_v1526_n_p47_Domene http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Probes Thermal diffusivity Defocusing Detection scheme Micro-structural characterization Microscopic levels Pump modulation Sample surface Surface curvatures Surface deformation Thermal expansion
spellingShingle	Probes Thermal diffusivity Defocusing Detection scheme Micro-structural characterization Microscopic levels Pump modulation Sample surface Surface curvatures Surface deformation Thermal expansion Domené, Esteban A. Mingolo, Nélida Martínez, Oscar Eduardo Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
topic_facet	Probes Thermal diffusivity Defocusing Detection scheme Micro-structural characterization Microscopic levels Pump modulation Sample surface Surface curvatures Surface deformation Thermal expansion
description	In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved. © 2013 Materials Research Society.
author	Domené, Esteban A. Mingolo, Nélida Martínez, Oscar Eduardo
author_facet	Domené, Esteban A. Mingolo, Nélida Martínez, Oscar Eduardo
author_sort	Domené, Esteban A.
title	Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_short	Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_full	Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_fullStr	Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_full_unstemmed	Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_sort	thermal expansion-recovery microscopy (therm) for microstructural characterization
publishDate	2013
url	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_02729172_v1526_n_p47_Domene http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
work_keys_str_mv	AT domeneestebana thermalexpansionrecoverymicroscopythermformicrostructuralcharacterization AT mingolonelida thermalexpansionrecoverymicroscopythermformicrostructuralcharacterization AT martinezoscareduardo thermalexpansionrecoverymicroscopythermformicrostructuralcharacterization
_version_	1768545281856503808

Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization

Ejemplares similares