Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach

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We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the r...

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Autores principales: Plá, J.C., Durán, J.C., Skigin, D.C., Depine, R.A.
Formato: JOUR
Materias:
Approximation theory
Conductive materials
Diffraction gratings
Electromagnetic field theory
Optics
Antireflective textured surfaces
Ray tracing
Antireflection coatings
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00304026_v107_n4_p141_Pla
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_00304026_v107_n4_p141_Pla
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spelling todo:paper_00304026_v107_n4_p141_Pla2023-10-03T14:40:21Z Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach Plá, J.C. Durán, J.C. Skigin, D.C. Depine, R.A. Approximation theory Conductive materials Diffraction gratings Electromagnetic field theory Optics Antireflective textured surfaces Ray tracing Antireflection coatings We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the ray optics approach and the other based on rigorous electromagnetic theory. As a first approach to the real problem, we consider a perfect conductive media. The parameter used for the characterisation of the problem is the wavelength to period ratio λ/d. The theoretical analysis presented here shows important discrepancies between the results obtained using the ray tracing approximation and those obtained using a rigorous electromagnetic method, even for small values of λ/d (of the order of 0.1) for which the geometrical optics approach is usually expected to hold. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00304026_v107_n4_p141_Pla
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Approximation theory
Conductive materials
Diffraction gratings
Electromagnetic field theory
Optics
Antireflective textured surfaces
Ray tracing
Antireflection coatings
spellingShingle Approximation theory
Conductive materials
Diffraction gratings
Electromagnetic field theory
Optics
Antireflective textured surfaces
Ray tracing
Antireflection coatings
Plá, J.C.
Durán, J.C.
Skigin, D.C.
Depine, R.A.
Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
topic_facet Approximation theory
Conductive materials
Diffraction gratings
Electromagnetic field theory
Optics
Antireflective textured surfaces
Ray tracing
Antireflection coatings
description We investigate the validity of the ray optics approach for the analysis of antireflecting structures used in photovoltaic solar cells. The antireflecting structure is simulated by a periodic grating with triangular profile and the reflected fields are calculated using two methods: one based on the ray optics approach and the other based on rigorous electromagnetic theory. As a first approach to the real problem, we consider a perfect conductive media. The parameter used for the characterisation of the problem is the wavelength to period ratio λ/d. The theoretical analysis presented here shows important discrepancies between the results obtained using the ray tracing approximation and those obtained using a rigorous electromagnetic method, even for small values of λ/d (of the order of 0.1) for which the geometrical optics approach is usually expected to hold.
format JOUR
author Plá, J.C.
Durán, J.C.
Skigin, D.C.
Depine, R.A.
author_facet Plá, J.C.
Durán, J.C.
Skigin, D.C.
Depine, R.A.
author_sort Plá, J.C.
title Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
title_short Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
title_full Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
title_fullStr Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
title_full_unstemmed Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: A first approach
title_sort ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces: a first approach
url http://hdl.handle.net/20.500.12110/paper_00304026_v107_n4_p141_Pla
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AT duranjc raytracingvselectromagneticmethodsintheanalysisofantireflectivetexturedsurfacesafirstapproach
AT skigindc raytracingvselectromagneticmethodsintheanalysisofantireflectivetexturedsurfacesafirstapproach
AT depinera raytracingvselectromagneticmethodsintheanalysisofantireflectivetexturedsurfacesafirstapproach
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